Fabricating method and testing method of semiconductor device and mechanical integrity testing apparatus

ABSTRACT

A fabricating method and a testing method of a semiconductor device and a mechanical integrity testing apparatus are provided. An object includes a wafer, an insulating layer, and a plurality of conductive posts is provided. A surface of the wafer has a plurality of first blind holes outside chip regions and a plurality of second blind holes inside the chip regions. The insulating layer is between the conductive posts and the walls of the first blind holes and between the conductive posts and the walls of the second blind holes. A mechanical integrity test is performed to test a binding strength between the insulating layer, the conductive posts, and the walls of the first blind holes. The conductive posts in the chip regions are electrically connected to an element after the conductive posts in the first blind holes are qualified in the mechanical integrity test.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims the priority benefit of Taiwan applicationserial no. 99141042, filed on Nov. 26, 2010. The entirety of theabove-mentioned patent application is hereby incorporated by referenceherein and made a part of this specification.

BACKGROUND

1. Technical Field

The disclosure relates to a fabricating method and a testing apparatus,in particular, to a fabricating method of a semiconductor device, and amechanical integrity testing apparatus.

2. Technical Art

As functions of the computer and other communication products arequickly developed and improved, recently in industries related to thesemiconductor, in order to meet the demands of diversification andmicro-miniaturization of the electronic products and other functions,the chip packaging process increasingly departs from the conventionaltechnique and is developed towards the high precision process having thehigh power, the high density, and the low cost, and being light, thin,short, and small, and a three-dimensional (3D) stacked integrated chip(IC) technique is developed to meet the demands. Although the concept ofthe 3D stacked IC has been proposed in several years ago, after thesemiconductor process enters the nano-level, the most urgent problem tobe solved is the yield of a through silicon via (TSV). It is theforemost topic in a reliability test how to test the integrity and theyield of the TSV. In the recent testing method, in most cases, thereliability test is performed after the 3DIC is already stacked, butusually the TSV structure is defective before the chip is stacked. Ifthe defective TSV is used to perform the process of stacking the chip,the cost and the time are wasted and the process does not have thebenefit. Therefore, it becomes quite important how to detect theintegrity and the yield of the TSV before the chip is stacked.

In a conventional package testing method, usually a shear test is usedto push a solder ball, so as to test the integrity of the solder ball ofa ball grid array (BGA) structure, thereby obtaining the reliability ofthe solder ball according to whether a normative force of the solderball is damaged. In addition, in the packaging structure using the wirebonding, the reliability is determined according to whether the wiresare hooked by the hook to break. In a usual 3DIC integration process, asshown in FIG. 17, after electroplated copper TSVs are fabricated and CuChemical Mechanical Polishing/Planarization (CMP) is performed, theintegrity of the TSV needs to be tested, but recently a TSV structureintegrity testing apparatus and a testing method do not exist.

SUMMARY

The disclosure is used to avoid a situation that a TSV structure isfound to be invalid when a chip including TSVs is 3D stackedsubsequently.

The disclosure is directed to a fabricating method of a semiconductordevice, capable of solving a problem that a defective TSV results inthat a fabricating cost of the semiconductor device is increased.

The disclosure is also directed to a mechanical integrity testingapparatus, capable of performing a mechanical integrity test on a TSVbefore a chip is stacked by applying the TSV.

The disclosure is further directed to a testing method of asemiconductor device, capable of solving a problem that a defective TSVresults in that a fabricating cost of the semiconductor device isincreased.

A fabricating method of a semiconductor device is introduced herein,which includes the following steps: providing a wafer including a firstsurface and a second surface; forming a plurality of blind holes on thefirst surface of the wafer; forming an insulating layer on a wall of theblind hole and the first surface of the wafer; forming a conductive postin the blind hole, and enabling a first surface of the conductive postto be exposed out of the insulating layer; and providing an externalforce to the first surface of the conductive post, and determining amechanical integrity of the conductive post according to whether theconductive post is damaged.

A mechanical integrity testing apparatus is introduced herein, whichincludes a testing fixture, a driver, and a data recorder. The testingfixture is used to test a binding strength between an insulating layer,one of a plurality of conductive posts, and a wall of a hole in whichthe conductive post is located of an object to be tested. The testingfixture includes a force application mechanism, in which the forceapplication mechanism applies an external force to the object to betested, for determining a mechanical integrity of the conductive postaccording to whether the conductive post is damaged. The driver isconnected to and drives the testing fixture. The data recorder is usedto record a driving energy provided by the driver to the testingfixture.

A testing method of a semiconductor device is introduced herein, whichincludes the following steps: providing an object to be tested, in whichthe object to be tested includes a wafer, an insulating layer, and aplurality of conductive posts, the wafer includes a first surface and asecond surface opposite to each other, the first surface of the waferincludes a plurality of blind holes, the insulating layer covers a wallof the blind hole, and the blind hole is filled with a conductive post;providing an external force to a first surface of the conductive post,and determining a mechanical integrity of the conductive post accordingto whether the conductive post is damaged; and cutting the wafer into aplurality of chips, and respectively connecting the chips to an elementthrough the conductive posts, after passing the test in the previousstep.

In view of the above, in a fabricating method of a semiconductor deviceaccording to the disclosure, firstly, a mechanical integrity of aconductive post is tested, and after it is confirmed that the mechanicalintegrity is qualified, subsequent processes of a chip are performed,thereby reducing a processing cost. In a mechanical integrity testingapparatus according to the disclosure, a mechanical integrity of aconductive post may be tested. In a testing method of a semiconductordevice according to the disclosure, a data base of standard bindingstrengths corresponding to conductive posts of various sizes may beestablished.

Several embodiments accompanied with figures are described in detailbelow to further describe the invention in details.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings are included to provide further understanding,and are incorporated in and constitute a part of this specification. Thedrawings illustrate exemplary embodiments and, together with thedescription, serve to explain the principles of the disclosure.

FIG. 1 is a flow chart of a fabricating method of a semiconductor deviceaccording to an embodiment of the disclosure.

FIGS. 2A to 2O are schematic partial cross-sectional views of afabricating method of a semiconductor device according to anotherembodiment of the disclosure.

FIG. 3 is a top view of an object to be tested of FIG. 2D.

FIGS. 4A and 4B are schematic partial cross-sectional views of amechanical integrity test of a fabricating method of a semiconductordevice according to another embodiment of the disclosure.

FIG. 5A is a schematic partial cross-sectional view of a mechanicalintegrity test of a fabricating method of a semiconductor deviceaccording to another embodiment of the disclosure.

FIGS. 5B and 5C are schematic partial cross-sectional views of amechanical integrity test of a fabricating method of a semiconductordevice according to another embodiment of the disclosure.

FIG. 6A is a schematic partial cross-sectional view of a mechanicalintegrity test of a fabricating method of a semiconductor deviceaccording to another embodiment of the disclosure.

FIG. 6B is a schematic partial cross-sectional view of a mechanicalintegrity test of a fabricating method of a semiconductor deviceaccording to another embodiment of the disclosure.

FIGS. 7 to 9 are schematic partial cross-sectional views of a mechanicalintegrity test of a fabricating method of a semiconductor deviceaccording to another three embodiments of the disclosure.

FIG. 10A is a flow chart of a testing method of a semiconductor deviceaccording to an embodiment of the disclosure.

FIG. 10B is a schematic partial cross-sectional view of a mechanicalintegrity test in the testing method of FIG. 10A.

FIG. 11 is a schematic view of a mechanical integrity testing apparatusaccording to an embodiment of the disclosure.

FIG. 12 is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure.

FIG. 13A is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure.

FIG. 13B is a schematic view of another mechanical integrity testperformed by the mechanical integrity testing apparatus of FIG. 13A.

FIG. 14 shows a push-up needle of a mechanical integrity testingapparatus according to another embodiment of the disclosure.

FIG. 15 is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure.

FIG. 16 is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure.

FIG. 17 is a schematic view of a conventional 3DIC integration process.

DETAILED DESCRIPTION OF DISCLOSED EMBODIMENTS

FIG. 1 is a flow chart of a fabricating method of a semiconductor deviceaccording to an embodiment of the disclosure. Referring to FIG. 1, thefabricating method of the semiconductor device according to thisembodiment includes the following steps: providing a wafer including afirst surface and a second surface; forming a plurality of blind holeson the first surface of the wafer; forming an insulating layer on a wallof the blind hole and the first surface of the wafer; forming aconductive post in the blind hole, and enabling a first surface of theconductive post to be exposed out of the insulating layer; and providingan external force to the first surface of the conductive post, anddetermining a mechanical integrity of the conductive post according towhether the conductive post is damaged. It may be known from the abovecontent that in the fabricating method of the semiconductor deviceaccording to this embodiment, it is firstly confirmed that theconductive post has the qualified integrity, and then, the conductiveposts in chip regions on the same object to be tested are used toperform subsequent processes. In this manner, probabilities that afabricated semiconductor device is defective due to the defectiveconductive posts are reduced, so as to lower a fabricating time and afabricating cost. In the following, more embodiments are listed, but thedisclosure is not limited hereto. In the disclosure, a random samplingtest may be performed, or a test may be arranged during the process. Inthe random sampling test, a yield of the conductive post of the wafer istested in batches, so as to determine whether the batch of wafers isavailable. If the test is performed during the process, each wafer maybe more directly selected with more helps. No matter which manner isused, it falls within the protection scope of the disclosure.

FIGS. 2A to 2O are schematic partial cross-sectional views of afabricating method of a semiconductor device according to anotherembodiment of the disclosure, and FIG. 3 is a top view of an object tobe tested of FIG. 2D. Referring to FIGS. 2A to 2C, before the object tobe tested 100 of FIG. 2D is prepared, firstly a complete wafer 110 iscleaned, and a plurality of blind holes, for example, first blind holesH12 and second blind holes H14 of FIG. 3, is formed on a first surfaceof the wafer 110 through a lithographically etching process. Then, aninsulating layer 120 is formed on the first surface of the wafer 110 anda wall of the blind hole, as shown in FIG. 2B. Next, a conductive layer132 is formed on the insulating layer 120 of the wafer 110, and theconductive layer 132 fills inside the first blind holes H12 and thesecond blind holes H14 of FIG. 3, as shown in FIG. 2C. A material of theconductive layer 132 is, for example, copper or other conductivematerials. Afterwards, a part of the conductive layer 132 is removedthrough a CMP process or other processes, so as to form conductive posts130 filling inside the first blind holes H12 and the second blind holesH14 of FIG. 3, and a first surface of the conductive post 130 is enabledto be exposed out of the insulating layer 120, as shown in FIG. 2D. InFIGS. 2A to 2D, a process of forming the first blind holes H12, theinsulating layer 120 and the conductive posts 130 of the correspondingregion are described. However, before, after or during the steps,various lines and elements required by the chips may be formed in chipregions R10 of the wafer 110 as shown in FIG. 3, and the conventionalart is not described here.

Referring to FIGS. 2D and 3, in the fabricating method of thesemiconductor device according to this embodiment, firstly, an object tobe tested 100 is provided, and FIG. 2D only shows a partial crosssection of the object to be tested 100. The object to be tested 100includes a wafer 110, an insulating layer 120, and a plurality ofconductive posts 130. The wafer 110 has a first surface 112 and a secondsurface 114 opposite to each other, as shown in FIG. 2D-2J. The wafer110 includes a plurality of chip regions R10, as shown in FIG. 3. Thefirst surface 112 has a plurality of first blind holes H12 and aplurality of second blind holes H14. The first blind holes H12 areoutside or between the chip regions R10, the second blind holes H14 areinside the chip regions R10. The insulating layer 120 covers the firstsurface 112, walls of the first blind holes H12, and walls of the secondblind holes H14, but FIG. 2D does not show that the insulating layer 120covers the walls of the second blind holes H14. The conductive posts 130fill inside the first blind holes H12 and the second blind holes H14,the insulating layer 120 is between the conductive post 130 and the wallof the first blind hole H12, and the insulating layer 120 is alsobetween the conductive post 130 and the wall of the second blind holeH14.

FIG. 3 shows positions of the first blind holes H12 between two chipregions R10 through magnification, but the first blind holes H12 mayalso be on peripheral regions of the wafer 110 or other regions exceptfor the chip regions R10, for example, a region R20. The position of thefirst blind hole H12 may be designed to be away from a cutting channelR30. The cutting channel R30 is a region through which a cutter passeswhen cutting the object to be tested 100 into a plurality of chips. Theconductive posts 130 in the first blind holes H12 on both sides of thecutting channel R30 are purely used to test a yield, and may be removedor kept after the test. Alternatively, the first blind holes H12 mayalso be directly designed to be in the cutting channel R30, and theconductive posts 130 in the first blind holes H12 may be used to testthe yield before the cutting, and may be removed during the cutting.

After the object to be tested 100 of FIG. 2D is provided, an externalforce is provided to the first surface of the conductive post 130, so asto perform a mechanical integrity test, thereby determining a mechanicalintegrity of the conductive post 130 according to whether the conductivepost 130 is damaged, that is, testing a binding strength between theinsulating layer 120, the conductive post 130, and the wall of the firstblind hole H12 in which the conductive post 130 is located, as shown inFIG. 2H. Next, subsequent processes may be performed, for example, afirst surface metal layer connected to the conductive post 130 isformed; the wafer 110 is bonded to a supporting substrate; the secondsurface of the wafer is polished, so as to expose a second surface ofthe conductive post; a second surface metal layer connected to thesecond surface of the conductive post 130 is formed; a plurality ofbumps is formed on the second surface of the conductive post; thesupporting substrate is removed; and the chips on the wafer 110 areconnected to another element through the bumps etc. The subsequentprocesses are further described in the following with reference to FIGS.2I to 2O.

The external force may be a pulling force manner, a pushing forcemanner, a suction force manner, or a bending manner. For example, thepulling force manner includes forming a photo-sensitive adhesive layerP10 on the first surface 112 of the wafer 110, as shown in FIG. 2E. Thephoto-sensitive adhesive layer P10 contacts with the first surface ofthe conductive post 130. Next, the photo-sensitive adhesive layer P10 islithographically etched, so as to form an adhesive sheet P12 on thefirst surface of each conductive post 130, as shown in FIGS. 2F and 2G.Afterwards, a probe 210 is connected to one exposed end of theconductive post 130 through the adhesive sheet P12, and applies apulling force to the conductive post 130. Here, a strength of thepulling force applied to the conductive post 130 by the probe 210 may bea preset value, if during the force application process, any one of theconductive post 130, the insulating layer 120, and the wall of the firstblind hole H12 is damaged or any two of the three are peeled off fromeach other (as shown in FIG. 2H), it represents that the object to betested 100 does not pass the mechanical integrity test. On the contrary,if the object to be tested 100 is not damaged by the pulling forceapplied to the conductive post 130 by the probe 210, it represents thatthe conductive post 130 is qualified in the mechanical integrity test.Here, the probe 210 is, for example, connected to the conductive post130 through the adhesive sheet P12, but the disclosure is not limitedhereto. In addition, before the probe 210 is connected to the conductivepost 130 through the adhesive sheet P12, a gasket 220 may be firstlyconfigured on the first surface 112. The gasket 220 has at least oneopening 222, the opening 222 exposes the conductive post 130 in thefirst blind hole H12 to be tested, and the probe 210 contacts with theadhesive sheet P12 through the opening 222.

In the above steps, it is not limited that the first blind hole H12 tobe tested is tested when being on the complete wafer 110, or after thepart of the object to be tested 100 having the first blind hole H12 iscut, which fall within the protection scope of the disclosure.

After the mechanical integrity test as shown in FIG. 2H is performed, ifthe conductive post 130 is qualified in the mechanical integrity test,all the steps may be completed after the subsequent processes, the waferof FIG. 3 is cut into chips 102, such that the conductive post 130 iselectrically connected to an element 50, for example, for the wafer asshown in FIG. 2O. The conductive post 130 of the chip 102 is originallyin the second blind hole H14 of FIG. 3, and before the stacked packagingis performed on the chip 102, two ends of the conductive post 130 may beexposed for being electrically connected. In the embodiment of FIG. 2O,one end of the conductive post 130 is electrically connected to anotherelement 50 through the bumps, and the element 50 is also a chip.However, the conductive post 130 may also be electrically connected tothe element 50 in other manners, and the element 50 may also be a linesubstrate or other elements.

Next, steps of manufacturing the common semiconductor device capable ofbeing performed during Steps 2H to 2O are exemplarily described, but thedisclosure is not limited hereto. As shown in FIG. 2I, if the conductivepost 130 is qualified in the mechanical integrity test, a circuit layer140 may be formed on the insulating layer 120 and the conductive post130. Afterwards, a supporting substrate 150 and the circuit layer 140are bonded, as shown in FIG. 2J. The supporting substrate 150 is, forexample, a silicon substrate or other substrates. Then, the supportingsubstrate 150 provides a supporting force, so as to thin the wafer 110from the second surface 114, until the conductive post 130 is exposed,as shown in FIG. 2K. The step of thinning the wafer 110 is, for example,performed in a polishing manner. Next, a circuit layer 160 is formed onthe second surface 114 of the thinned wafer 110, and the circuit layer160 is electrically connected to at least a part of the conductive post130, as shown in FIG. 2L. Then, bumps 170 are formed on the circuitlayer 160, as shown in FIG. 2M. In not shown embodiments, the circuitlayer 160 may include a sphere-bottom metal layer. Afterwards, thesupporting substrate 150 is removed, as shown in FIG. 2N. After the stepas shown in FIG. 2N is completed, the finished product may be used inthe step of FIG. 2O.

In the above mentioned, the fabricating method of the semiconductordevice according to an embodiment of the disclosure is completelyintroduced. Next, for the fabricating method of the semiconductor deviceaccording to other embodiments of the disclosure, only steps used toreplace the mechanical integrity test as shown in FIGS. 2E to 2H areintroduced, and for the remaining steps, please refer to FIGS. 2A to 2D,and FIG. 2O.

FIGS. 4A and 4B are schematic partial cross-sectional views of themechanical integrity test of the fabricating method of the semiconductordevice according to another embodiment of the disclosure. Referring toFIG. 4A, firstly, a suction nozzle 310 is aligned with the first surfaceof the conductive post 130 in the first blind hole H12. Next, as shownin FIG. 4B, the suction nozzle 310 applies a suction force having apreset strength to the first surface of the conductive post 130, so asto determine the mechanical integrity of the conductive post 130according to whether the conductive post 130 is damaged, therebydetermining whether the conductive post 130 is qualified in themechanical integrity test.

FIG. 5A is a schematic partial cross-sectional view of the mechanicalintegrity test of the fabricating method of the semiconductor deviceaccording to another embodiment of the disclosure. After a part of theconductive layer 132 is removed through the CMP process or otherprocesses (referring to FIG. 2C) and only the conductive post 130 in thefirst blind hole H12 is kept (referring to FIG. 2D), the wafer 110 maybe completely thinned until the conductive post 130 is exposed. Next,referring to FIG. 5A, a push-up needle 410 applies a pushing force tothe first surface 130A of the conductive post 130, so as to determinethe mechanical integrity of the conductive post 130 according to whetherthe conductive post 130 is damaged, thereby determining whether theconductive post 130 is qualified in the mechanical integrity test. Inother embodiments, after the wafer 110 is completely thinned until theconductive post 130 is exposed, the push-up needle 410 applies thepushing force to the second surface 130B of the conductive post 130,that is, the push-up needle 410 applies the pushing force to the surfaceof the conductive post 130 being exposed after the wafer 110 is thinned,so as to determine the mechanical integrity of the conductive post 130.

FIGS. 5B and 5C are schematic partial cross-sectional views of themechanical integrity test of the fabricating method of the semiconductordevice according to another embodiment of the disclosure. Referring toFIGS. 5B and 5C, this embodiment is different from the embodiment ofFIG. 5A that the wafer 110 is not completely thinned, but a testing holeH20 is formed on the second surface 114 of the wafer 110. The testinghole H20 exposes the conductive post 130 in at least one first blindhole H12, as shown in FIG. 5B. Next, as shown in FIG. 5C, a push-upneedle 410 applies a pushing force to the conductive post 130, so as todetermine the mechanical integrity of the conductive post 130 accordingto whether the conductive post 130 is damaged, thereby determiningwhether the conductive post 130 is qualified in the mechanical integritytest. In this embodiment, the gasket 220 is also used, but the gasket220 may also be not used.

FIG. 6A is a schematic partial cross-sectional view of the mechanicalintegrity test of the fabricating method of the semiconductor deviceaccording to another embodiment of the disclosure. Referring to FIG. 6A,firstly a testing hole H22 is formed on the second surface 114 of thewafer 110. The testing hole H22 exposes a plurality of conductive posts130 in a plurality of first blind holes H12. Next, a push-up needle 412applies a pushing force to the plurality of conductive posts 130, so asto determine the mechanical integrity of the conductive post 130according to whether the conductive post 130 is damaged, therebydetermining whether the plurality of conductive posts 130 is qualifiedin the mechanical integrity test. In this embodiment, a gasket 320 isalso used, but the gasket 320 may also be not used. An opening 322 ofthe gasket 320 exposes the plurality of conductive posts 130.

FIG. 6B is a schematic partial cross-sectional view of the mechanicalintegrity test of the fabricating method of the semiconductor deviceaccording to another embodiment of the disclosure. Referring to FIG. 6B,this embodiment is different from the embodiment of FIG. 6A that thepush-up needle 412 of this embodiment applies the pushing force to theconductive post 130 from the testing hole H22, and the first surface 112of the wafer 110 contacts with the gasket 320. The gasket 320 is afixture used to support the wafer 110.

FIGS. 7 to 9 are schematic partial cross-sectional views of themechanical integrity test of the fabricating method of the semiconductordevice according to another three embodiments of the disclosure.Referring to FIG. 7, after the object to be tested 100 as shown in FIG.2D is provided, a testing piece 104 may be separated from the object tobe tested 100. The testing piece 104 includes a first blind hole H12.The mechanical integrity test of this embodiment is a three-pointbending test performed on the testing piece 104. Referring to FIG. 8,after the object to be tested 100 as shown in FIG. 2D is provided, atesting piece 106 may be separated from the object to be tested 100. Thetesting piece 106 includes a plurality of first blind holes H12. Themechanical integrity test of this embodiment is a three-point bendingtest performed on the testing piece 106. Referring to FIG. 9, themechanical integrity test of this embodiment is a four-point bendingtest performed on the testing piece 106.

In addition, before the mechanical integrity test of the embodiments ofFIGS. 7 to 9 is performed, the CMP process or other processes may beperformed, such that two ends of the conductive post 130 on the testingpiece are exposed. Before the mechanical integrity test of theembodiments of FIGS. 5B and 6B is performed, the complete part to betested may be separated from the object to be tested 100 of FIG. 2D, andthe CMP process or other processes may be performed, such that two endsof the conductive post 130 on the testing piece are exposed.

It is described in the above embodiments that in the mechanicalintegrity test, the strength of the force applied to the conductive postis a preset value. In the following, a testing method of a semiconductordevice according to the disclosure is introduced, firstly, an object tobe tested is provided, as shown in Step S110. Next, a binding strengthbetween an insulating layer, a conductive post, and a wall of a blindhole in which the conductive post is located of the object to be testedis tested, as shown in Step S120. Then, conductive posts in chip regionsof the object to be tested are electrically connected to an element, asshown in Step S130. In the disclosure, obtained data may be used toestablish a data base of sizes and due binding strengths of theconductive posts. FIG. 10A is a flow chart of the testing method of thesemiconductor device according to an embodiment of the disclosure, andFIG. 10B is a schematic partial cross-sectional view of a mechanicalintegrity test in the testing method of FIG. 10A. Referring to FIGS. 10Aand 10B, the testing method of the semiconductor device according tothis embodiment includes the following steps. An object to be tested 700is provided, in Step S210. The object to be tested 700 includes asubstrate 710, an insulating layer 720, and a plurality of conductiveposts 730. The substrate 710 has a first surface 712 and a secondsurface 714 opposite to each other. The first surface 712 has aplurality of blind holes H72. The insulating layer 720 covers the firstsurface 712 and a wall of the blind hole H72. The conductive posts 730fill inside the blind holes H72, and the insulating layer 720 is betweenthe conductive post 730 and the wall of the blind hole H72. Like theobject to be tested 100 of the embodiment of FIG. 3, the object to betested 700 has a plurality of chip regions, but the object to be tested700 may also be purely formed by the substrate 710, the insulating layer720, and the conductive posts 730, but does not include the chip region,that is to say, the object to be tested 700 is purely used to test theintegrity of the conductive post 730. In addition, in this embodiment,the plurality of conductive posts 730 is taken as an example, but inother embodiments, a single conductive post exists. In addition, theconductive posts 730 of this embodiment, for example, have the samesize, but the conductive posts having various different sizes may alsobe provided on a single object to be tested, so as to perform themechanical integrity test on the conductive posts having the varioussizes for one time.

Next, the mechanical integrity test is performed, so as to test thebinding strength between the insulating layer 720, the conductive post730, and the wall of the blind hole H72, and set a standard bindingstrength of the conductive post 730, in Step S220. An actual performingmanner of the mechanical integrity test performed here is similar to theembodiment of FIG. 2H, but the actual performing manners of otherembodiments may also be adopted. In addition, the mechanical integritytest performed here is different from the above embodiments that theforce applied to the conductive post 730 is gradually increased, untilany one of the conductive post 730, the insulating layer 720, and thewall of the blind hole H72 is damaged or any two of the three are peeledoff from each other, and the maximal applied force (damaging force) isrecorded. Afterwards, the due standard binding strength of theconductive post 730 having the size is set according to the recordedmaximal force. The standard binding strength is usually set according tothe data after a plurality of maximal forces is obtained after themechanical integrity test is performed on the conductive posts 73 havingthe same size for several times.

Afterwards, the above two steps are repeated, so as to set a pluralityof standard binding strengths corresponding to the conductive posts 730having various sizes, and establish a data base to store the pluralityof standard binding strengths corresponding to the conductive posts 730having various sizes, in Step S230.

After the data base is established, during the process of fabricatingthe semiconductor device, before the conductive post is electricallyconnected to a circuit layer or another element, the conductive post istested by using the standard binding strength in the data base. That isto say, the data base is used when the mechanical integrity test isperformed during the process of fabricating the semiconductor device ofFIG. 1. Specifically, the mechanical integrity test is performed byusing the standard binding strength corresponding to the size of theconductive post in the data base. Afterwards, the conductive postpassing the mechanical integrity test and being not damaged iselectrically connected to the element.

FIG. 11 is a schematic view of a mechanical integrity testing apparatusaccording to an embodiment of the disclosure. Referring to FIG. 11, themechanical integrity testing apparatus 200 according to this embodimentincludes a testing fixture 202, a driver 230, and a data recorder 240.The testing fixture 202 is used to test a binding strength between aninsulating layer 120, a conductive post 130, and a wall of a first blindhole H12 of an object to be tested 100, wherein the conductive post 130is located in the first blind hole H12. The driver 230 is connected toand drives the testing fixture 202. The data recorder 240 is used torecord a driving energy provided by the driver 230 to the testingfixture 202. The mechanical integrity testing apparatus 200 according tothis embodiment is used to test the object to be tested 100 before achip stacking process is performed, so as to determine that theconductive post 130 has a qualified integrity. In this manner,probabilities that a fabricated semiconductor device is defective due tothe defective conductive posts are reduced, so as to lower a fabricatingtime and a fabricating cost. The mechanical integrity test of thedisclosure may adopt a batch sampling test or may be performed duringthe process.

The testing fixture 202 includes a force application mechanism, and theforce application mechanism applies an external force to the object tobe tested, so as to determine a mechanical integrity of the conductivepost according to whether the conductive post is damaged. The forceapplication mechanism is a pulling force mechanism, a pushing forcemechanism, a suction force mechanism, or a bending mechanism.

The testing fixture 202 of this embodiment is, for example, a pullingforce mechanism including a probe 210, the probe 210 is connected to oneexposed end of the conductive post 130 in the first blind hole H12, andpulls the conductive post 130 from the first blind hole H12. However,the conductive post 130 may also be in a through hole. The pulling forcemechanism of this embodiment further includes a gasket 220 configured onthe object to be tested 100. The gasket 220 has an opening 222, theopening 222 exposes the conductive post 130 in the first blind hole H12to be tested, and the probe 210 contacts with the adhesive sheet P12through the opening 222.

The driver 230 of this embodiment is a stretcher, so as to perform astretching experiment through the probe 210. The data recorder 240 mayrecord the driving energy provided by the driver 230 to the testingfixture 202 during the stretching experiment, in which the drivingenergy of this embodiment is a stretching force. The maximal stretchingforce recorded by the data recorder 240 is a damaging force resultingthat any one of the conductive post 130, the insulating layer 120, andthe wall of the first blind hole H12 is damaged or any two of the threeare peeled off from each other. In addition, the probe 210 may onlyapply the stretching force of a preset strength to the conductive post130, so as to determine whether the conductive post 130 may bear thestretching force of the preset strength, and the real damaging forcerequired by the damage is not necessarily measured.

FIG. 12 is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure. Referring to FIG. 12,the mechanical integrity testing apparatus 300 according to thisembodiment is similar to the mechanical integrity testing apparatus 200of FIG. 11, such that only differences are introduced in the following.A testing fixture 302 of this embodiment is, for example, a suctionforce mechanism including a suction nozzle 310, the suction nozzle 310is aligned with the conductive post 130 in the first blind hole H12, andpulls the conductive post 130 from the first blind hole H12. A driver330 of this embodiment is a vacuum pumping device, for providing asuction force required by the suction nozzle 310. A data recorder 340may record a suction force provided by the driver 330 to the testingfixture 302 during the mechanical integrity test. The maximal suctionforce recorded by the data recorder 340 is a damaging force resultingthat any one of the conductive post 130, the insulating layer 120, andthe wall of the first blind hole H12 is damaged or any two of the threeare peeled off from each other. In addition, the suction nozzle 310 mayonly apply the suction force of a preset strength to the conductive post130, so as to determine whether the conductive post 130 may bear thesuction force of the preset strength, and the real damaging forcerequired by the damage is not necessarily measured.

FIG. 13A is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure. Referring to FIG.13A, the mechanical integrity testing apparatus 400 according to thisembodiment is similar to the mechanical integrity testing apparatus 200of FIG. 11, such that only differences are introduced in the following.A testing fixture 402 of this embodiment is, for example, a pushingforce mechanism including a push-up needle 410, for ejecting theconductive post 130 from the first blind hole H12. A driver 430 of thisembodiment is an ejector, for performing a pushing experiment throughthe push-up needle 410. A data recorder 440 may record a pushing forceprovided by the driver 430 to the testing fixture 402 during themechanical integrity test. The maximal pushing force recorded by thedata recorder 440 is a damaging force resulting that any one of theconductive post 130, the insulating layer 120, and the wall of the firstblind hole H12 is damaged or any two of the three are peeled off fromeach other. In addition, the push-up needle 410 may only apply thepushing force of a preset strength to the conductive post 130, so as todetermine whether the conductive post 130 may bear the suction force ofthe preset strength, and the real damaging force required by the damageis not necessarily measured. In this embodiment, the object to be tested100 is configured between the gasket 220 and the push-up needle 410.

FIG. 13B is a schematic view of another mechanical integrity testperformed by the mechanical integrity testing apparatus of FIG. 13A.Referring to FIG. 13B, this embodiment is different from the embodimentof FIG. 13A that in this embodiment, after the wafer 110 is completelythinned until the conductive post 130 is exposed, the push-up needle 410applies the pushing force to the conductive post 130, so as to determinewhether the conductive post 130 is qualified in the mechanical integritytest.

In another embodiment, the push-up needle 412 has a plurality ofejection ends 412A, for ejecting the plurality of conductive posts fromthe plurality of holes in which the conductive posts are located, asshown in FIG. 14.

FIG. 15 is a schematic view of a mechanical integrity testing apparatusaccording to another embodiment of the disclosure. Referring to FIG. 15,the mechanical integrity testing apparatus 500 according to thisembodiment is similar to the mechanical integrity testing apparatus 200of FIG. 11, and only differences are introduced in the following. Atesting fixture 502 of this embodiment is, for example, a bendingmechanism being a three-point bending mechanism, for performing athree-point bending test on the object to be tested 100. In anotherembodiment, a testing fixture 602 of a mechanical integrity testingapparatus 600 is, for example, a bending mechanism being a four-pointbending mechanism, as shown in FIG. 16.

To sum up, in the fabricating method of the semiconductor deviceaccording to the disclosure, firstly, the binding strength between theinsulating layer, the conductive post, and the wall of the blind hole istested, and after it is confirmed that the binding strength isqualified, the chips are electrically connected to another elementthrough the conductive posts, thereby avoiding increasing the processingcost due to the defective conductive posts. The mechanical integritytesting apparatus according to the disclosure may test the bindingstrength between the insulating layer, the conductive post, and the wallof the blind hole.

It will be apparent to those skilled in the art that variousmodifications and variations can be made to the structure of thedisclosed embodiments without departing from the scope or spirit of theinvention. In view of the foregoing, it is intended that the inventioncover modifications and variations of this invention provided they fallwithin the scope of the following claims and their equivalents.

1. A fabricating method of a semiconductor device, comprising: providinga wafer comprising a first surface and a second surface; forming aplurality of blind holes on the first surface of the wafer; forming aninsulating layer on a wall of the blind hole and the first surface ofthe wafer; forming a conductive post in the blind hole, and enabling afirst surface of the conductive post to be exposed out of the insulatinglayer; and providing an external force to the first surface of theconductive post, and determining a mechanical integrity of theconductive post according to whether the conductive post is damaged. 2.The fabricating method of a semiconductor device according to claim 1,wherein the external force is a pulling force manner, a pushing forcemanner, a suction force manner, or a bending manner.
 3. The fabricatingmethod of a semiconductor device according to claim 2, wherein thepulling force manner comprises: connecting a probe to the first surfaceof the conductive post; and applying a pulling force to the conductivepost by the probe.
 4. The fabricating method of a semiconductor deviceaccording to claim 3, wherein the step of connecting the probe to theconductive post comprises: forming a photo-sensitive adhesive layer onthe first surface of the wafer; lithographically etching thephoto-sensitive adhesive layer, so as to form an adhesive sheet on thefirst surface of each conductive post; and connecting the probe to thefirst surface of the conductive post through the adhesive sheet.
 5. Thefabricating method of a semiconductor device according to claim 4,wherein before the step of connecting the probe to the first surface ofthe conductive post through the adhesive sheet, the method furthercomprises configuring a gasket on the first surface, wherein the gasketcomprises at least one opening, the opening exposes the conductive postin the first blind hole, such that the probe contacts with the adhesivesheet through the opening.
 6. The fabricating method of a semiconductordevice according to claim 2, wherein the suction force manner comprises:aligning a suction nozzle with the first surface of the conductive postin the blind hole; and applying a suction force to the first surface ofthe conductive post by the suction nozzle.
 7. The fabricating method ofa semiconductor device according to claim 2, wherein the pushing forcemanner comprises: enabling the wafer to expose the conductive post in atleast one blind hole; and applying a pushing force to the first surfaceor a second surface of the conductive post by a push-up needle.
 8. Thefabricating method of a semiconductor device according to claim 7,wherein the manner of enabling the wafer to expose the conductive postin at least one blind hole comprises forming a testing hole on thesecond surface of the wafer, wherein the testing hole exposes theconductive post in at least one blind hole.
 9. The fabricating method ofa semiconductor device according to claim 1, wherein the conductive postis disposed in the blind hole of the wafer, so as to form an object tobe tested.
 10. The fabricating method of a semiconductor deviceaccording to claim 9, wherein before the step of providing the externalforce to the first surface of the conductive post, and determining themechanical integrity of the conductive post according to whether theconductive post is damaged, the method further comprises separating atesting piece from the object to be tested, wherein the testing piececomprises at least one blind hole, and a mechanical integrity testcomprises a three-point bending test or a four-point bending testperformed on the testing piece.
 11. The fabricating method of asemiconductor device according to claim 10, before the step of providingthe external force to the first surface of the conductive post, anddetermining the mechanical integrity of the conductive post according towhether the conductive post is damaged, the method further comprisesenabling two ends of at least one conductive post on the testing pieceto be exposed.
 12. A mechanical integrity testing apparatus, comprising:a testing fixture, for testing a binding strength between an insulatinglayer, one of a plurality of conductive posts, and a wall of a hole inwhich the conductive post is located of an object to be tested, thetesting fixture comprising a force application mechanism, wherein theforce application mechanism applies an external force to the object tobe tested, for determining a mechanical integrity of the conductive postaccording to whether the conductive post is damaged; a driver, connectedto and driving the testing fixture; and a data recorder, for recording adriving energy provided by the driver to the testing fixture.
 13. Themechanical integrity testing apparatus according to claim 12, whereinthe force application mechanism is a pulling force mechanism, a pushingforce mechanism, a suction force mechanism, or a bending mechanism. 14.The mechanical integrity testing apparatus according to claim 13,wherein the force application mechanism comprises a probe, for beingconnected to a first surface of the conductive post in the hole, andapplying a pulling force to the conductive post.
 15. The mechanicalintegrity testing apparatus according to claim 14, wherein the forceapplication mechanism further comprises a gasket, for being configuredon the object to be tested, and comprising an opening, wherein the probeis used to pass through the opening to be connected to the conductivepost.
 16. The mechanical integrity testing apparatus according to claim14, wherein the driver is a stretcher.
 17. The mechanical integritytesting apparatus according to claim 13, wherein the suction forcemechanism comprises a suction nozzle, for being aligned with a firstsurface of the conductive post in the hole, and applying a suction forceto the conductive post.
 18. The mechanical integrity testing apparatusaccording to claim 17, wherein the suction force mechanism furthercomprises a gasket, for being configured on the object to be tested, andcomprising an opening, wherein the suction nozzle is used to passthrough the opening to be aligned with the conductive post.
 19. Themechanical integrity testing apparatus according to claim 17, whereinthe driver is a vacuum pumping device.
 20. The mechanical integritytesting apparatus according to claim 13, wherein the pushing forcemechanism comprises at least one push-up needle, for applying a pushingforce to the conductive post.
 21. The mechanical integrity testingapparatus according to claim 20, wherein the pushing force mechanismfurther comprises a gasket, the object to be tested is suitable to beconfigured on the gasket, the gasket comprises an opening, and theconductive post passes through the opening when being ejected from thehole.
 22. The mechanical integrity testing apparatus according to claim20, wherein the driver is an ejector.
 23. The mechanical integritytesting apparatus according to claim 12, wherein the bending mechanismis a three-point bending mechanism or a four-point bending mechanism.24. A testing method of a semiconductor device, comprising: providing anobject to be tested, wherein the object to be tested comprises a wafer,an insulating layer, and a plurality of conductive posts, the wafercomprises a first surface and a second surface opposite to each other,the first surface of the wafer comprises a plurality of blind holes, theinsulating layer covers a wall of the blind hole, and the blind hole isfilled with a conductive post; and providing an external force to afirst surface of the conductive post, and determining a mechanicalintegrity of the conductive post according to whether the conductivepost is damaged.
 25. The testing method of a semiconductor deviceaccording to claim 24, wherein the wafer comprises a plurality of chipregions, the blind hole comprises a plurality of first blind holes and aplurality of second blind holes, the first blind holes are outside thechip regions, the second blind holes are inside the chip regions, andthe insulating layer is between the conductive posts and walls of thefirst blind holes and between the conductive posts and walls of thesecond blind holes.
 26. The testing method of a semiconductor deviceaccording to claim 25, wherein the step of determining the mechanicalintegrity comprises testing a binding strength between the insulatinglayer, one of the conductive posts, and a wall of the first blind holein which the conductive post is located.
 27. The testing method of asemiconductor device according to claim 24, wherein the external forceis a pulling force manner, a pushing force manner, a suction forcemanner, or a bending manner.
 28. The testing method of a semiconductordevice according to claim 27, wherein the pulling force mannercomprises: connecting a probe to the first surface of the conductivepost; and applying a pulling force to the conductive post by the probe.29. The testing method of a semiconductor device according to claim 28,wherein the step of connecting the probe to the conductive postcomprises: forming a photo-sensitive adhesive layer on the first surfaceof the wafer; lithographically etching the photo-sensitive adhesivelayer, so as to form an adhesive sheet on the first surface of eachconductive post; and connecting the probe to the first surface of theconductive post through the adhesive sheet.
 30. The testing method of asemiconductor device according to claim 29, wherein before the step ofconnecting the probe to the first surface of the conductive post throughthe adhesive sheet, the method further comprises configuring a gasket onthe first surface, wherein the gasket comprises at least one opening,the opening exposes the conductive post in the first blind hole, suchthat the probe contacts with the adhesive sheet through the opening. 31.The testing method of a semiconductor device according to claim 27,wherein the suction force manner comprises: aligning a suction nozzlewith the first surface of the conductive post in the first blind hole;and applying a suction force to the first surface of the conductive postby the suction nozzle.
 32. The testing method of a semiconductor deviceaccording to claim 27, wherein the pushing force manner comprises:forming a testing hole on a second surface of the wafer, wherein thetesting hole exposes the conductive post in at least one first blindhole; and applying a pushing force to the first surface or the secondsurface of the conductive post by a push-up needle.
 33. The testingmethod of a semiconductor device according to claim 26, wherein theconductive post is disposed in the blind hole of the wafer, so as toform an object to be tested.
 34. The testing method of a semiconductordevice according to claim 33, wherein before the step of providing theexternal force to the first surface of the conductive post, anddetermining the mechanical integrity of the conductive post according towhether the conductive post is damaged, the method further comprisesseparating a testing piece from the object to be tested, wherein thetesting piece comprises at least one first blind hole, and a mechanicalintegrity test comprises a three-point bending test or a four-pointbending test performed on the testing piece.
 35. The testing method of asemiconductor device according to claim 34, before the step of providingthe external force to the first surface of the conductive post, anddetermining the mechanical integrity of the conductive post according towhether the conductive post is damaged, the method further comprisesenabling two ends of at least one conductive post on the testing pieceto be exposed.
 36. The testing method of a semiconductor deviceaccording to claim 24, wherein the object to be tested is a first objectto be tested; the method further comprises performing a mechanicalintegrity test, so as to obtain data of the mechanical integrity of thefirst object to be tested, and store the data to a data base; andrepeating the steps, so as to obtain testing data of mechanicalintegrities of various different objects to be tested, and store thetesting data to the data base.
 37. The testing method of a semiconductordevice according to claim 36, further comprising: providing a secondobject to be tested, wherein the second object to be tested comprises awafer, a second insulating layer, and a second conductive post, thewafer comprises a third surface, the third surface comprises a secondblind hole, the second insulating layer covers the third surface and awall of the second blind hole, the second conductive post fills insidethe second blind hole, and the second insulating layer is between thesecond conductive post and the wall of the second blind hole; obtainingdata of the second conductive post; obtaining the data being the same asthe second conductive post from the data base, and performing themechanical integrity test; and determining whether the second conductivepost is damaged according to whether the mechanical integrity passes thetest.
 38. The testing method of a semiconductor device according toclaim 24, wherein after the step of determining the mechanical integrityof the conductive post, the method further comprises cutting the waferinto a plurality of chips, and respectively connecting the chips to anelement through the conductive posts.